Sidorenko S.I.

Direct and Inverse Problems of Computer-Based Materials Design

The paper analyzes tasks associated with new materials design recently applied in material science in light of the principle stating that new knowledge design should be based on the previously accumulated knowledge, as well as wide application of computer technologies and operating with material science databases. We show that the general problem of computer design of materials should be divided into 3 problems. The aim of the direct problem is to construct the interpolation polynomial based on available materials science discrete databases available.

Cyclic Character of the Microhardness Aluminium Alloy D16 under Ultrasonic Impact Treatment

The article studies possibilities of more effective surface hardening as compared with conventional thermo-mechanical processing. Specifically, we provide the insight into surface hardening of light structural alloys by ultrasonic impact treatment (UIT) in air under quasi-hydrostatic pressure of the sample.

Diffusion Growth of Mn4Si7 Silicide Phase Inclusions of Cylindrical Shape in Mn–Si Thin-Film System

We study the process of diffusion formation of Mn4Si7 silicide phase inclusions in films, obtained by deposition of Mn and Si (24% Mn + Si) on a substrate of Si (001) monocrystalline silicon. We utilize the methods of X-ray diffraction analysis, electron microscopy, and mass spectrometry of secondary ions for our experiments. Furthermore, computer simulation within the frame of the model of cylindrical inclusions growth in a supersaturated solid solution allows analyzing concentration allocation of the diffusant, which depends on time, kinetics of inclusions growth, etc.

The phase formation in Ti(200 нм)/Cu(200 нм)/Ti(100 нм)/SiO[sub]2[/sub](370 нм) film composition on the monocrystalline silicon (001)

Using the methods of X-ray diffraction, scanning electron microscopy and resistometry measurements, we investigated the solid-state reactions in the Ti(200 nm)/Cu(200 nm)/Ti(100 nm)/SiO2(370nm) multilayered film composition on the monocrystaline silicon of (001) orientation. We obtained the film composition by the consecutive electron-beam deposition of the element layers in vacuum of about 10-4 Pa without breaking vacuum on the silicon substrate with the oxide layer, which was grown by wet oxidation on the surface.

The influence of the annealings on the phase formation in [Ta(3,3 нм)/Si(6,6 нм)][sub]45[/sub]/Si (001) multilayer film composition and its optical properties

Employing the methods of spectroscopic ellipsometry, X-ray phase analysis and resistometry, we study the influence of heat treatment on the phase formation in periodic (45 bilayers) [Ta(3,3 нм)/ Si(6,6 нм)]45/ Si(001) multilayered film composition (MFC) with middle volume composition of TaSi2. Through experiments performed, we determine the regularities of change of the optical properties and energetic spectra of electrons as a result of translation symmetry loss in tantalum disilicide.

The Solid-State Reactions in Ti(200 nm)/Cu(200 nm)/Ti(100 nm)/SiO2(370 nm) Film Composition on the Monocrystalline Silicon (001)

By employing the methods of X-ray diffraction, transmission electron microscopy of cross-sections, scanning electron microscopy and resistometry measurements, we examine the solid-state reactions in the Ti(200 nm)/Cu(200nm)/Ti(10nm)/SiO2(370nm) film composition on the mono¬crystaline silicon of (001) orientation. The film composition under study is obtained by consecutive electron-beam deposition of elements layers in a vacuum of about 104 Pa without breaking a vacuum on the substrate of silicon with an oxide layer on the surface.

Phase transformations and physical зroperties of nanodimensional fe50pt50 (30 nm)/sio2(100 nm)/si(001) film system

In this paper, we study conditions of the magnetically ordered L10(FePt) phase with a face-centered tetragonal lattice in the nanodimensional Fe50Pt50 (30 nm)/SiO2(100 nm)/Si(001) film system at annealing in nitrogen. We also investigate its structure, morphology, electric and magnetic properties. On the experimental side, we show that the magnetically ordered L10(FePt) phase with rectangular grains is formed in Fe50Pt50 films after annealing at 720 K.